• DocumentCode
    3383168
  • Title

    A 10B 200MHz pipeline ADC with minimal feedback penalty and 0.35pJ/conversion-step

  • Author

    Chen, Gang ; Luo, Yifei ; Tian, Jiayin ; Zhou, Kuan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of New Hampshire, Durham, NH, USA
  • fYear
    2010
  • fDate
    27-29 Sept. 2010
  • Firstpage
    59
  • Lastpage
    64
  • Abstract
    A 200MHz 10-bit pipeline analog-to-digital converter (ADC) that includes a novel multiplying digital-to-analog converter (MDAC) architecture is presented. The proposed MDAC architecture minimizes the feedback penalty, resulting more than 75% power reduction and 50% output noise reduction than those traditional architectures. The proposed MDAC dramatically reduces the settling time and operates much closer to the unity gain frequency of the amplifier. The proposed 10-bit ADC achieves a peak signal-to-noise-and-distortion-ratio (SNDR) of 55.8dB and this SNDR translates to a figure of merit (FOM) of 0.35pJ/conversion-step. To our best knowledge, this is the minimum power consumption ever reported for pipeline ADCs beyond the 200MHz sampling rate and without complex digital calibration. This design has been implemented with the IBM 90nm CMOS technology. The ADC has a 1.2V power supply and 1.2V peak-to-peak differential input signal.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; digital-analogue conversion; CMOS technology; analog-to-digital converter; conversion-step; figure of merit; frequency 200 MHz; minimal feedback penalty; multiplying digital-to-analog converter architecture; pipeline ADC; signal-to-noise-and-distortion-ratio; size 90 nm; voltage 1.2 V; word length 10 bit; Bandwidth; Capacitors; Computer architecture; Noise; Noise measurement; Pipelines; Power demand;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2010 IEEE International
  • Conference_Location
    Las Vegas, NV
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-6682-5
  • Type

    conf

  • DOI
    10.1109/SOCC.2010.5784665
  • Filename
    5784665