Title :
Stochastic analysis of power, latency and the degree of concurrency
Author :
Chen, Yuan ; Mitrani, Isi ; Shang, Delong ; Xia, Fei ; Yakovlev, Alex
Author_Institution :
China Acad. of Railway Sci., Beijing, China
fDate :
May 30 2010-June 2 2010
Abstract :
Concurrent processing has become the default mode of operation in on-chip systems. Silicon has become cheap enough for having hardware facilities to support very large scale concurrent processing on chip. As a result the availability and applicability of power is becoming more of a limiting factor than logic. However, the advantage of parallelism in reducing power consumption will soon become unrealistic because of the limited scope of reducing Vdd beyond threshold voltage, leaving the reduction of concurrency (through the partial shut-down of system blocks) as a realistic means of reducing power consumption when needed. A stochastic modelling approach is presented in this paper which can integrate the degree of concurrency as a parameter into power and latency analysis. This will facilitate a system design and management regime where the degree of concurrency is used as a means of control to achieve power and performance goals.
Keywords :
elemental semiconductors; integrated circuit modelling; silicon; stochastic processes; Si; concurrent processing; degree of concurrency; latency analysis; on-chip systems; power analysis; power consumption reduction; stochastic analysis; stochastic modelling approach; system design; threshold voltage; very large scale concurrent processing; Concurrent computing; Delay; Energy consumption; Hardware; Large-scale systems; Logic; Silicon; Stochastic processes; System-on-a-chip; Threshold voltage;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537601