• DocumentCode
    3383244
  • Title

    Stochastic analysis of power, latency and the degree of concurrency

  • Author

    Chen, Yuan ; Mitrani, Isi ; Shang, Delong ; Xia, Fei ; Yakovlev, Alex

  • Author_Institution
    China Acad. of Railway Sci., Beijing, China
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    4129
  • Lastpage
    4132
  • Abstract
    Concurrent processing has become the default mode of operation in on-chip systems. Silicon has become cheap enough for having hardware facilities to support very large scale concurrent processing on chip. As a result the availability and applicability of power is becoming more of a limiting factor than logic. However, the advantage of parallelism in reducing power consumption will soon become unrealistic because of the limited scope of reducing Vdd beyond threshold voltage, leaving the reduction of concurrency (through the partial shut-down of system blocks) as a realistic means of reducing power consumption when needed. A stochastic modelling approach is presented in this paper which can integrate the degree of concurrency as a parameter into power and latency analysis. This will facilitate a system design and management regime where the degree of concurrency is used as a means of control to achieve power and performance goals.
  • Keywords
    elemental semiconductors; integrated circuit modelling; silicon; stochastic processes; Si; concurrent processing; degree of concurrency; latency analysis; on-chip systems; power analysis; power consumption reduction; stochastic analysis; stochastic modelling approach; system design; threshold voltage; very large scale concurrent processing; Concurrent computing; Delay; Energy consumption; Hardware; Large-scale systems; Logic; Silicon; Stochastic processes; System-on-a-chip; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537601
  • Filename
    5537601