DocumentCode :
3383348
Title :
Adaptive Surface Fitting for Inspection of FPD Devices Using Multilevel B-spline Approximation
Author :
Lee, Gyu-Bong ; Kim, Woo-Seob ; Chung, Yun-Su ; Lee, Joon-Jae ; Park, Kil-Houm
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., DaeGu
fYear :
2005
fDate :
21-24 Nov. 2005
Firstpage :
1
Lastpage :
4
Abstract :
This paper proposes a surface fitting algorithm for inspection of flat panel display(FPD) based on multilevel B-spline approximation (MBA). FPD devices have non-uniform background, and shape and intensity of defects are very various. MBA is useful algorithm for surface fitting but it is sensitive to number of control lattices. As level increases, details of original image can be reconstructed. To detect defect, defective area must not be well-reconstructed. In this paper, we propose a level decision method of MBA for FPD. After process of each level, we decide whether stop to increase level of MBA or not with simple distance measure. Experimental result shows that our proposed method makes to detect defects easy.
Keywords :
flat panel displays; flaw detection; image reconstruction; inspection; object detection; optoelectronic devices; production engineering computing; splines (mathematics); surface fitting; FPD device inspection; adaptive surface fitting; control lattice; defect detection; defect intensity; defect shape; flat panel display; image reconstruction; multilevel B-spline approximation; Computer displays; Computer science; Humans; Information security; Inspection; Lattices; Polynomials; Shape; Spline; Surface fitting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2005 2005 IEEE Region 10
Conference_Location :
Melbourne, Qld.
Print_ISBN :
0-7803-9311-2
Electronic_ISBN :
0-7803-9312-0
Type :
conf
DOI :
10.1109/TENCON.2005.301017
Filename :
4085243
Link To Document :
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