• DocumentCode
    3383442
  • Title

    A differential read subthreshold SRAM bitcell with self-adaptive leakage cut off scheme

  • Author

    Na, Bai ; Chen, Xuan ; Jun, Yang ; Longxin, Shi

  • Author_Institution
    Nat. ASIC Syst. Eng. Res. Center, Southeast Univ., Nanjing, China
  • fYear
    2010
  • fDate
    27-29 Sept. 2010
  • Firstpage
    455
  • Lastpage
    460
  • Abstract
    Leakage energy increases dramatically in subthreshold region because delay increases exponentially with decreasing supply voltage. Compared to generic logic, subthreshold SRAM blocks consume more leakage energy. However, all most previous subthreshold analyzes ignore the leakage current in both active operation and standby operation. To address this challenge, a differential read subthreshold SRAM is presented in this paper. Buffering circuit and reconfigurable operating principle ensure both read and standby stability without the expense of writability. Combined with dynamic cut off scheme, the leakage current of the proposed design is reduced remarkably in both active and standby operation without increasing dynamic energy dissipation or performance penalty.
  • Keywords
    SRAM chips; buffer circuits; leakage currents; buffering circuit; differential read subthreshold SRAM bitcell; dynamic energy dissipation; performance penalty; self-adaptive leakage cut off scheme; Current distribution; Energy dissipation; Leakage current; Random access memory; Stability analysis; Transient analysis; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2010 IEEE International
  • Conference_Location
    Las Vegas, NV
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-6682-5
  • Type

    conf

  • DOI
    10.1109/SOCC.2010.5784678
  • Filename
    5784678