DocumentCode
3383442
Title
A differential read subthreshold SRAM bitcell with self-adaptive leakage cut off scheme
Author
Na, Bai ; Chen, Xuan ; Jun, Yang ; Longxin, Shi
Author_Institution
Nat. ASIC Syst. Eng. Res. Center, Southeast Univ., Nanjing, China
fYear
2010
fDate
27-29 Sept. 2010
Firstpage
455
Lastpage
460
Abstract
Leakage energy increases dramatically in subthreshold region because delay increases exponentially with decreasing supply voltage. Compared to generic logic, subthreshold SRAM blocks consume more leakage energy. However, all most previous subthreshold analyzes ignore the leakage current in both active operation and standby operation. To address this challenge, a differential read subthreshold SRAM is presented in this paper. Buffering circuit and reconfigurable operating principle ensure both read and standby stability without the expense of writability. Combined with dynamic cut off scheme, the leakage current of the proposed design is reduced remarkably in both active and standby operation without increasing dynamic energy dissipation or performance penalty.
Keywords
SRAM chips; buffer circuits; leakage currents; buffering circuit; differential read subthreshold SRAM bitcell; dynamic energy dissipation; performance penalty; self-adaptive leakage cut off scheme; Current distribution; Energy dissipation; Leakage current; Random access memory; Stability analysis; Transient analysis; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference (SOCC), 2010 IEEE International
Conference_Location
Las Vegas, NV
ISSN
Pending
Print_ISBN
978-1-4244-6682-5
Type
conf
DOI
10.1109/SOCC.2010.5784678
Filename
5784678
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