DocumentCode :
3383485
Title :
Prediction of connectors long term performance from accelerated thermal aging tests
Author :
Rosen, Gabliela ; Coghill, Alex ; Tunca, Necla
Author_Institution :
Digital Equipment of Canada Ltd., Kanata, Ont., Canada
fYear :
1992
fDate :
18-21 Oct. 1992
Firstpage :
257
Lastpage :
263
Abstract :
The authors discuss surface films and report their effects on the long-term electrical stability of contacts, based on thermal aging tests. The surface films discussed are: residual plating salts, tin oxide, and tin oxide in the presence of lubricant. Surface film effects are found to be detrimental to the performance of electrical connectors because they lead to increases in low-level contact resistance. Of the three films studied, the tin oxide in the presence of lubricant is shown to cause the most significant changes in low-level contact resistance.<>
Keywords :
ageing; contact resistance; electric connectors; electrical contacts; electronic equipment testing; life testing; lubrication; SnO/sub 2/ film; accelerated thermal aging tests; electrical connectors; long-term electrical stability; low-level contact resistance; lubrication; residual plating salts; surface film effect; Accelerated aging; Connectors; Contact resistance; Force measurement; Life estimation; Lubricants; Temperature; Testing; Thermal stresses; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1992., Proceedings of the Thirty-Eighth IEEE Holm Conference on
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-0576-0
Type :
conf
DOI :
10.1109/HOLM.1992.246908
Filename :
246908
Link To Document :
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