• DocumentCode
    3383506
  • Title

    Environmental testing of elastomeric connectors

  • Author

    Tunca, Necla ; Rose, Georg

  • Author_Institution
    Digital Equipment of Canada Ltd., Kanata, Ont., Canada
  • fYear
    1992
  • fDate
    18-21 Oct. 1992
  • Firstpage
    249
  • Lastpage
    255
  • Abstract
    The electrical performance of metal-in-elastometer connectors is evaluated for chip-on-board applications. Flowing mixed gas (FMG) class-II corrosion and dust tests are performed in accelerated conditions to simulate the long-term operating life of connectors in office-type environments. To explore the functional limits, the connectors are also tested in FMG class-III conditions, which simulate industrial environments. The parameters, low-level contact resistance (LLCR) and surface insulation resistance (SIR) leakage current, are monitored throughout the test to assess electrical stability. Special requirements for the printed circuit boards used in applications with metal-in-elastometer connectors are identified by metallurgical analysis after the corrosion tests. The test results show that the elastometer connectors are viable interconnect media in corrosion and dust environments. Good electrical performance (long-term stability) is attributed to the gasket-like sealing properties of the high density separable connectors.<>
  • Keywords
    contact resistance; corrosion testing; elastomers; electric connectors; environmental testing; leakage currents; life testing; printed circuit accessories; FMG class-III conditions; LLCR; SIR; accelerated testing; chip-on-board applications; dust tests; electrical performance; electrical stability; environmental testing; flowing mixed gas class II corrosion test; gasket-like sealing properties; high density separable connectors; industrial environments; interconnect media; leakage current; long term operating life simulation; long-term stability; low-level contact resistance; metal-in-elastometer connectors; metallurgical analysis; office-type environments; printed circuit boards; surface insulation resistance; Circuit simulation; Circuit stability; Circuit testing; Connectors; Contact resistance; Corrosion; Life estimation; Life testing; Performance evaluation; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1992., Proceedings of the Thirty-Eighth IEEE Holm Conference on
  • Conference_Location
    Philadelphia, PA, USA
  • Print_ISBN
    0-7803-0576-0
  • Type

    conf

  • DOI
    10.1109/HOLM.1992.246909
  • Filename
    246909