DocumentCode :
3383615
Title :
Development of redesign process for digital VLSI system
Author :
Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
2
fYear :
1997
fDate :
3-6 Aug. 1997
Firstpage :
1001
Abstract :
Re-engineering of electronic circuits has received considerable interest in the design automation community. Re-engineering is the examination and alternation of a system to reconstitute it in a new form, which potentially involves changes at the requirements, design, and implementation level. This paper deals with "redesign" problem in which the original implementation information is either missing or incomplete. Given a target circuit with a test set and blocks of missing gates, a circuit is redesignable if the transfer function of each block of missing gates can be derived from the partial knowledge in existing implementation. The derived transfer functions are then used to construct the missing blocks. This paper presents a redesign process for digital circuits and systems.
Keywords :
VLSI; circuit CAD; digital integrated circuits; integrated circuit design; transfer functions; design automation community; digital VLSI system; implementation information; partial knowledge; redesign process; transfer function; Circuit simulation; Circuit testing; Design automation; Digital circuits; Electronic circuits; Fault diagnosis; Process design; Reverse engineering; Transfer functions; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
Print_ISBN :
0-7803-3694-1
Type :
conf
DOI :
10.1109/MWSCAS.1997.662245
Filename :
662245
Link To Document :
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