• DocumentCode
    3383615
  • Title

    Development of redesign process for digital VLSI system

  • Author

    Wey, Chin-Long

  • Author_Institution
    Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    3-6 Aug. 1997
  • Firstpage
    1001
  • Abstract
    Re-engineering of electronic circuits has received considerable interest in the design automation community. Re-engineering is the examination and alternation of a system to reconstitute it in a new form, which potentially involves changes at the requirements, design, and implementation level. This paper deals with "redesign" problem in which the original implementation information is either missing or incomplete. Given a target circuit with a test set and blocks of missing gates, a circuit is redesignable if the transfer function of each block of missing gates can be derived from the partial knowledge in existing implementation. The derived transfer functions are then used to construct the missing blocks. This paper presents a redesign process for digital circuits and systems.
  • Keywords
    VLSI; circuit CAD; digital integrated circuits; integrated circuit design; transfer functions; design automation community; digital VLSI system; implementation information; partial knowledge; redesign process; transfer function; Circuit simulation; Circuit testing; Design automation; Digital circuits; Electronic circuits; Fault diagnosis; Process design; Reverse engineering; Transfer functions; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
  • Print_ISBN
    0-7803-3694-1
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1997.662245
  • Filename
    662245