• DocumentCode
    3383669
  • Title

    Characterization and Performance Analysis of LPCVD Germanium-on-Silicon C-Band Photodiodes

  • Author

    Orcutt, J.S. ; Olubuyide, O.O. ; DiLello, N. ; Hoyt, J.L. ; Ram, R.J.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge
  • fYear
    2007
  • fDate
    19-22 Aug. 2007
  • Firstpage
    92
  • Lastpage
    94
  • Abstract
    Spatially-resolved photoresponse and bias-dependent modulation measurements of large area vertically-illuminated germanium photodiodes are presented. These measurements are compared with finite-element device simulations to theorize possible sources of performance limitations revealed by different measurement conditions.
  • Keywords
    Ge-Si alloys; photodiodes; semiconductor materials; Ge-Si; LPCVD germanium-on-silicon C-band photodiodes; finite-element device simulations; spatial characterization; Buffer layers; Current measurement; Frequency response; Geometry; Germanium; Passivation; Performance analysis; Performance evaluation; Photodetectors; Photodiodes; germanium photodiodes; photodiode characterization; spatial characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics in Switching, 2007
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-4244-1121-1
  • Electronic_ISBN
    1-4244-1122-X
  • Type

    conf

  • DOI
    10.1109/PS.2007.4300752
  • Filename
    4300752