Title :
An all-digital smart temperature sensor with auto-calibration in 65nm CMOS technology
Author :
Chung, Ching-Che ; Yang, Cheng-Ruei
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
fDate :
May 30 2010-June 2 2010
Abstract :
A novel fully digital CMOS smart temperature sensor with auto-calibration circuit in 65nm CMOS technology is presented. The proposed auto-calibration circuit can greatly reduce the temperature calibration efforts, and therefore it is very suitable for on-chip dynamic thermal management applications. The power consumption of the proposed circuit is 55μW with 1.0V supply.
Keywords :
CMOS digital integrated circuits; calibration; intelligent sensors; system-on-chip; temperature sensors; autocalibration circuit; digital CMOS smart temperature sensor; on-chip dynamic thermal management application; power consumption; size 65 nm; temperature calibration; CMOS technology; Calibration; Circuits; Energy consumption; Monitoring; Power system management; Runtime; System-on-a-chip; Temperature sensors; Thermal management;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537625
