Title :
Reliability analysis of logic circuits based on signal probability
Author :
Franco, Denis Teixeira ; Vasconcelos, Maí Correia ; Naviner, Lirida ; Naviner, Jean-François
Author_Institution :
Inst. TELECOM, TELECOM ParisTech, Paris
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
This paper presents a reliability analysis algorithm that can be integrated in the design flow of logic circuits. Based on a four state representation of signal probabilities, and the propagation of this probabilities along the cells of a circuit, the signal reliability of the circuit can be directly obtained. The use of signal probabilities rises the well known problem of signals correlation, and we present some relaxing conditions that allow tradeoffs between accuracy and execution time of the algorithm. The main advantages of the proposed methodology are its simplicity and straightforward application, allowing an easy integration with design tools.
Keywords :
circuit reliability; logic circuits; probability; design flow; logic circuits; reliability analysis; signal probability; Algorithm design and analysis; Circuit analysis; Circuit faults; Combinational circuits; Integrated circuit reliability; Logic circuits; Power system reliability; Signal analysis; Signal design; Telecommunications;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
DOI :
10.1109/ICECS.2008.4674942