• DocumentCode
    3383847
  • Title

    Reliability analysis of logic circuits based on signal probability

  • Author

    Franco, Denis Teixeira ; Vasconcelos, Maí Correia ; Naviner, Lirida ; Naviner, Jean-François

  • Author_Institution
    Inst. TELECOM, TELECOM ParisTech, Paris
  • fYear
    2008
  • fDate
    Aug. 31 2008-Sept. 3 2008
  • Firstpage
    670
  • Lastpage
    673
  • Abstract
    This paper presents a reliability analysis algorithm that can be integrated in the design flow of logic circuits. Based on a four state representation of signal probabilities, and the propagation of this probabilities along the cells of a circuit, the signal reliability of the circuit can be directly obtained. The use of signal probabilities rises the well known problem of signals correlation, and we present some relaxing conditions that allow tradeoffs between accuracy and execution time of the algorithm. The main advantages of the proposed methodology are its simplicity and straightforward application, allowing an easy integration with design tools.
  • Keywords
    circuit reliability; logic circuits; probability; design flow; logic circuits; reliability analysis; signal probability; Algorithm design and analysis; Circuit analysis; Circuit faults; Combinational circuits; Integrated circuit reliability; Logic circuits; Power system reliability; Signal analysis; Signal design; Telecommunications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
  • Conference_Location
    St. Julien´s
  • Print_ISBN
    978-1-4244-2181-7
  • Electronic_ISBN
    978-1-4244-2182-4
  • Type

    conf

  • DOI
    10.1109/ICECS.2008.4674942
  • Filename
    4674942