• DocumentCode
    3384073
  • Title

    A comparison of bandwidth setting concepts for Q-enhanced LC-tanks in deep-sub micron CMOS processes

  • Author

    Bormann, Dirk ; Werth, Tobias D. ; Zimmermann, Niklas ; Wunderlich, Ralf ; Heinen, Stefan

  • Author_Institution
    Dept.of Integrated Analog Circuits, RWTH Aachen, Aachen
  • fYear
    2008
  • fDate
    Aug. 31 2008-Sept. 3 2008
  • Firstpage
    726
  • Lastpage
    729
  • Abstract
    In this paper LC-resonator bandwidth setting techniques in deep-sub micron CMOS processes are examined and compared with the main focus on Q-enhancement, linearity, noise, power consumption and controllability at low supply voltages. Simulations have been performed using an ideal amplifier model to achieve results independent of the purpose of the circuit. The Q-enhancement is achieved by positive feedback into the gates of a cross coupled MOSFET transistor pair. The different Q-tuning concepts include current control techniques as well as capacitive subdivision in the feedback path. As result of this work, a combination of tail current controlled and capacitive subdivision has been found to be the best mean to achieve highest linearity at good controllability. Simulation results show that a quality factor around 100 is possible at a current consumption of maximum 3 mA. The equivalent input noise does not exceed 1.5 nV/radic(Hz) with total harmonic distortion around 0.005% which makes the circuit reasonable for application in LNAs as well as for transmitter structures.
  • Keywords
    CMOS integrated circuits; MOSFET; Q-factor; electric current control; harmonic distortion; low-power electronics; oscillators; LC-resonator bandwidth setting techniques; Q-enhanced LC-tanks; bandwidth setting concepts; capacitive subdivision; cross coupled MOSFET transistor; current control techniques; deep-sub micron CMOS processes; power consumption; quality factor; total harmonic distortion; Bandwidth; CMOS process; Circuit noise; Circuit simulation; Controllability; Energy consumption; Feedback; Linearity; Low voltage; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
  • Conference_Location
    St. Julien´s
  • Print_ISBN
    978-1-4244-2181-7
  • Electronic_ISBN
    978-1-4244-2182-4
  • Type

    conf

  • DOI
    10.1109/ICECS.2008.4674956
  • Filename
    4674956