DocumentCode
3384616
Title
P-n junction from solution: Cuprous oxide p-n homojunction by electrodeposition
Author
Wang, L. ; Han, K. ; Han, X. ; Tao, M.
Author_Institution
University of Texas at Arlington, 76019, USA
fYear
2008
fDate
11-16 May 2008
Firstpage
1
Lastpage
6
Abstract
Inorganic solar cells are traditionally fabricated by vacuum-based semiconductor processing. Although cuprous oxide (Cu2 O) can be synthesized by wet-chemical methods, its natural p-type conductivity has prevented an efficient p-n homojunction solar cell. In this paper we report the effect of solution pH on the conduction type (n- or p-type) of Cu2 O in electrodeposition. It is found that Cu2 O electrodeposited at bath pH below 7.5 is n-type, while Cu2 O deposited at bath pH above 9 is p-type. This is likely because bath pH controls the amount of oxygen incorporated into the growing Cu2 O film and thus the nature of native point defects. Capacitance-voltage and photocurrent measurements confirm that the conduction type of Cu2 O can be controlled by bath pH. X-ray diffraction and scanning electron microscopy reveal that while n-type Cu2 O deposited on Cu substrate appears amorphous, n-type Cu2 O deposited on p-type polycrystalline Cu2 O is polycrystalline. Current-voltage measurements indicate that Al makes ohmic contacts to n-type Cu2 O and Cu to p-type Cu2 O. Furthermore, a two-step process is adopted to deposit p-type and n-type Cu2 O in sequence for the formation of a p-n homojunction in Cu2 O. Photocurrent and current-voltage characterization confirm that a p-n homojunction of Cu2 O is achieved.
Keywords
Amorphous materials; Capacitance measurement; Capacitance-voltage characteristics; Conductivity; P-n junctions; Photoconductivity; Photovoltaic cells; Scanning electron microscopy; Substrates; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location
San Diego, CA, USA
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2008.4922869
Filename
4922869
Link To Document