Thermal estimation for accurate estimation of impact of BTI aging effects on nano-scale SRAM circuits

Temperature and power are interrelated. With increase in temperature, power dissipation increases and vice versa. This paper analyzes the interdependency of power dissipation and temperature and also presents simulation results obtained by deriving the final power and temperature for nano-scale SRAM circuits with any environmental condition. Given the strong temperature dependence of BTI aging effects, accurate temperature estimation is an important step in determining the impact of aging effects on SRAM. As an example, the thermal estimation for a conventional SRAM and a power gated SRAM are performed to show the comparative impact of BTI aging effects on both the circuits.