DocumentCode
3384784
Title
Multi-cycle compress technique for high-speed IP in low-cost environment
Author
Chen, Gong-Han ; Lin, Chu-Chuan ; Wu, Po-Han ; Rau, Jiann-Chyi
Author_Institution
Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
fYear
2010
fDate
May 30 2010-June 2 2010
Firstpage
437
Lastpage
440
Abstract
We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR can bring a lot of data by using a few bits. We calculate the ATE data by Gauss-Elimination and put the ATE data to our decompression architecture to generate a lot of patterns. And one ATE data will run several times in the architecture. If some faults cannot be detected, we will generate the patterns which are brought by fault simulation. If still a few faults cannot be detected, the faults will be caught by directly modify the bits of ATE data. The less ATE data we use, the less cycles we need. Because the reason, we can get high speed testing. And the less data, the low-cost environment we need. The cycle we can save is up to 61.60x. And the average rate of compression can get 19.33x.
Keywords
automatic test pattern generation; data compression; fault simulation; integrated circuit testing; shift registers; ATE data calculation; Gauss elimination; LFSR; decompression architecture; fault simulation; high-speed IP; linear feedback shift register; multicycle compression technique; Circuit faults; Circuit testing; Counting circuits; Fault detection; Flip-flops; Gaussian processes; Linear feedback shift registers; Pins; Test data compression; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-5308-5
Electronic_ISBN
978-1-4244-5309-2
Type
conf
DOI
10.1109/ISCAS.2010.5537677
Filename
5537677
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