DocumentCode :
3384800
Title :
Homogenisation of negative refractive index metamaterials: comparison of effective parameters of broadside-coupled and edge-coupled split-ring resonators
Author :
Seetharamdoo, D. ; Sauleau, R. ; Tarot, A.C. ; Mahdjoubi, K.
Author_Institution :
IETR, UMR CNRS, Rennes, France
Volume :
4
fYear :
2004
fDate :
20-25 June 2004
Firstpage :
3761
Abstract :
Different approaches have been considered to realise negative refractive index (NRI) metamaterials. We focus on the use of split-ring resonators (SRR), and investigate edge-coupled SRR (EC-SRR) and broadside coupled SRR (BC-SRR). We propose a free-space matched metamaterial consisting of BC-SRR. Firstly, a homogenisation procedure accounting for the transverse periodicity of the composite in the plane of incidence is developed. This analysis has, to our knowledge, not been done elsewhere. Secondly, this procedure is applied to the two different SRR-based metamaterials. They are compared in terms of their effective permittivity, εeff, and permeability, μeff. Moreover, the influence on μeff and εeff of the variation of the different constituents of the metamaterial, namely the dielectric substrate permittivity and loss tangent and the pattern layout, is investigated. The sensitivity of both metamaterials to dielectric and metallic losses is also discussed.
Keywords :
dielectric losses; dielectric materials; inhomogeneous media; magnetic permeability; periodic structures; permittivity; refractive index; broadside-coupled split-ring resonators; dielectric losses; edge-coupled split-ring resonators; effective parameters; effective permeability; effective permittivity; free-space matched metamaterial; homogenisation procedure; loss tangent; metallic losses; negative refractive index metamaterials; pattern layout; transverse periodicity; Art; Copper; Metamaterials; Permeability; Reflection; Refractive index; Resonance; Roentgenium; Slabs; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
Type :
conf
DOI :
10.1109/APS.2004.1330165
Filename :
1330165
Link To Document :
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