Title :
Fast measurements of electron emission current and X-ray intensity during pulsed vacuum breakdown
Author :
Djogo, G. ; Cross, J.D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Abstract :
Breakdown experiments were performed for a point-plane gap in a technical vacuum by applying overshooting 1/50-μs impulse voltage. The electron emission current and X-ray intensity during breakdown development were measured with a high-bandwidth measuring system. These measurements were synchronized with the ultrafast streak photography of breakdown development. The streak photographs showed oscillations in cathode luminosity which had a constant frequency of 200 MHz, while the waveforms of electron emission current and X-ray intensity showed no oscillations. The results show that models that attribute oscillations of cathode luminosity to oscillations in the electron emission current are invalid
Keywords :
X-ray emission spectra; electric breakdown; electron field emission; impulse testing; insulation testing; streak photography; vacuum insulation; 200 MHz; X-ray intensity; electron emission current; oscillations in cathode luminosity; point-plane gap; pulsed vacuum breakdown; ultrafast streak photography; Anodes; Bandwidth; Breakdown voltage; Cathodes; Current measurement; Electric breakdown; Electron emission; Plasma measurements; Pulse measurements; Vacuum breakdown;
Conference_Titel :
Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0649-X
DOI :
10.1109/ELINSL.1992.246990
