Title :
Diagnosis of soft-fault in analog circuit based on FNLP
Author :
Shi, Yibing ; Zhou, Longfu ; Zhang, Wei
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
A new soft-fault diagnosis approach for analog circuit with parameter tolerance is proposed in this paper. The approach uses fuzzy nonlinear programming (FNLP) concept to diagnose analog circuit under test quantitatively. Node-voltage incremental equations, as constraints of FNLP equation, are built based on the sensitivity analysis. Through evaluating the parameters deviations from the solution of the FNLP equation, it can be stated that whether the actual parameters are within tolerance ranges or some components are faulty. Examples illustrate the proposed approach and show its effectiveness.
Keywords :
analogue circuits; circuit testing; fault diagnosis; nonlinear programming; sensitivity analysis; FNLP concept; analog circuit under test; fuzzy nonlinear programming; node-voltage incremental equation; parameter tolerance; sensitivity analysis; soft-fault diagnosis approach; Analog circuits; Circuit faults; Circuit testing; Costs; Fault diagnosis; Linear programming; Manufacturing industries; Nonlinear equations; Sensitivity analysis; Voltage;
Conference_Titel :
Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on
Conference_Location :
Milpitas, CA
Print_ISBN :
978-1-4244-4886-9
Electronic_ISBN :
978-1-4244-4888-3
DOI :
10.1109/ICCCAS.2009.5250333
