High frequency characterization of multilayered anisotropic planar circuits with several metallized interfaces

An efficient computation technique is developed for analysis anisotropic multilayered microwave circuits constituted of several conducting strips/slots which are located on several interfaces of dielectric layers. Used technique is based on extension of spectral domain approach. The numerical solutions obtained by this technique are discussed and compared with the published data. The technique is believed useful in the determination of dispersion characteristics of those circuits such as effective dielectric constant, phase velocity and normalized wavelength.