DocumentCode :
3385254
Title :
High speed CDR using a novel binary phase detector with probable-lock-detection
Author :
Bui, Hung Tien
Author_Institution :
Dept. of Appl. Sci., Univ. du Quebec a Chicoutimi, Chicoutimi, QC
fYear :
2008
fDate :
Aug. 31 2008-Sept. 3 2008
Firstpage :
1006
Lastpage :
1009
Abstract :
In this paper, we present a novel high speed binary phase detector for clock and data recovery (CDR) applications. We also introduce a new probable-lock detector which is used to alleviate the classic tradeoff between acquisition time and jitter. The probable-lock detector is used in the CDR to generate a higher gain during the acquisition process and reduce this gain when clock and data are locked. The proposed solutions have been designed in a 180 nm CMOS technology using standard cells and have been incorporated in a 1 Gb/s mixed-signal CDR. Simulation results validate the proposed solutions and confirm that the system operates as expected.
Keywords :
CMOS integrated circuits; clock and data recovery circuits; mixed analogue-digital integrated circuits; phase detectors; CMOS; acquisition time; binary phase detector; clock and data recovery; jitter; mixed-signal CDR; probable-lock detection; size 180 nm; CMOS technology; Circuit simulation; Clocks; Detectors; Filters; Jitter; Phase detection; Signal generators; Signal processing; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
Type :
conf
DOI :
10.1109/ICECS.2008.4675026
Filename :
4675026
Link To Document :
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