Title :
Impacts of signal slew and skew variations on delay uncertainty and crosstalk noise in coupled RLC global interconnects
Author :
Roy, Abinash ; Xu, Jingye ; Chowdhury, Masud H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
This paper addresses the impacts of signal slew time and signal skew variations on delay uncertainty and cross talk noise in coupled inductive lines for different switching patterns. Our findings reveal that delay variation in a victim line always increases with the reduction of signal slew time and increase in signal skew. We also observe that cross talk noise reduces with increasing signal skew, and the impacts of skew variation on cross talk noise is more prominent for lines with strong capacitive coupling. Here, equivalent circuit model parameters have been extracted using FastCap and FastHenry field solvers, and results have been obtained by HSpice simulation.
Keywords :
RLC circuits; SPICE; crosstalk; integrated circuit interconnections; FastCap; FastHenry field solvers; HSpice simulation; coupled RLC global interconnects; crosstalk noise; delay uncertainty; equivalent circuit model parameters; signal slew-skew variations; CMOS technology; Capacitance; Circuit simulation; Coupling circuits; Crosstalk; Delay effects; Inductance; Integrated circuit interconnections; Propagation delay; Uncertainty;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
DOI :
10.1109/ICECS.2008.4675038