Title :
Expedited-compact architecture for average scan power reduction
Author :
Saeed, Samah Mohamed Ahmed ; Sinanoglu, Ozgur
Abstract :
In expedited-compact scan, the output response of the STUMPS channels is smartly compacted without the overhead of the full-scan chain-shift operation, thereby reducing the scan mode power. The authors propose suitable integration with other scan compression methods.
Keywords :
design for testability; integrated circuit testing; DB+EC architecture; STUMPS channel; average scan power reduction; design-for-testability; expedited-compact architecture; expedited-compact scan; output response; Compaction; Computer architecture; Microprocessors; Multiplexing; Power dissipation; Switches; Testing; Test power; response compaction; scan power; shift power; test compression;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDT.2012.2213793
