DocumentCode
3385513
Title
Digital signal propagation on a wafer-scale smart active programmable interconnect
Author
Valorge, Olivier ; Nguyen, Anh Tuan ; Blaquière, Yves ; Norman, Richard ; Savaria, Yvon
Author_Institution
Groupe de Rech. en Microelectron. et en Microsystemes, Univ. du Quebec e Montreal, Montreal, QC
fYear
2008
fDate
Aug. 31 2008-Sept. 3 2008
Firstpage
1059
Lastpage
1062
Abstract
This paper investigates the signal integrity and performance of a novel programmable interconnect technology called DreamWafertrade. This programmable circuit board uses a wafer-scale circuit with a sea of tiny contacts to adapt to the contact type, size, spacing and alignment of external components. Supporting this ability to adapt requires a dense internal programmable interconnect network to propagate digital signals between arbitrary sets of contacts. The means to propagate the digital signals are described and characterized. Propagation delays of the chain as well as its rise and fall time characteristics are simulated. Preliminary results show that under normal conditions, the links can operate up to 630 MHz and have a mean latency of 0.3 ns/mm. Eye diagrams demonstrate improvements in the signal integrity when a signal is propagated on the DreamWafertrade interconnect compared to when it is propagated on a traditional PCB trace; the eye remains open and neat, independently of the linkpsilas length.
Keywords
integrated circuit interconnections; programmable circuits; wafer-scale integration; digital signal propagation; programmable circuit board; propagation delays; wafer scale integration; wafer-scale smart active programmable interconnect; Circuit simulation; Field programmable gate arrays; Integrated circuit interconnections; Printed circuits; Propagation delay; Prototypes; Repeaters; Space technology; Timing; Wafer scale integration; Interconnect; Propagation Delay; Reprogrammable Circuit Board; Timing; Wafer Scale Integration (WSI);
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location
St. Julien´s
Print_ISBN
978-1-4244-2181-7
Electronic_ISBN
978-1-4244-2182-4
Type
conf
DOI
10.1109/ICECS.2008.4675039
Filename
4675039
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