Title :
Smooth awakenings: Reactivation noise suppressed low-leakage and robust MTCMOS flip-flops
Author :
Jiao, Hailong ; Kursun, Volkan
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fDate :
May 30 2010-June 2 2010
Abstract :
Ground bouncing noise produced during the sleep to active mode transitions is an important reliability concern in multi-domain Multi-Threshold CMOS (MTCMOS) integrated circuits. Ground bouncing noise, leakage power consumption, and data stability of MTCMOS flip-flops are evaluated in this paper. The effectiveness of different circuit techniques is discussed for achieving lower noise during the reactivation events while maintaining robust and low-leakage data retention capability in MTCMOS flip-flops.
Keywords :
CMOS logic circuits; flip-flops; integrated circuit reliability; low-power electronics; data stability; ground bouncing noise; leakage power consumption; low-leakage data retention capability; reactivation noise suppressed low-leakage flip-flops; reliability concern; robust MTCMOS flip-flops; smooth awakenings; Active noise reduction; Circuit noise; Circuit stability; Energy consumption; Flip-flops; Integrated circuit noise; Integrated circuit reliability; Latches; Noise robustness; Random access memory;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537716
