• DocumentCode
    3385635
  • Title

    Study of thermal oxidation in medium density polyethylene

  • Author

    Gubanski, S.M. ; Karlsson, K. ; Gedde, U.

  • Author_Institution
    Dept. of Electr. Plant Eng., R. Inst. of Technol., Stockholm, Sweden
  • fYear
    1992
  • fDate
    7-10 Jun 1992
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    Studies of thermal oxidation in a well-characterized medium-density polyethylene (MDPE) were performed using thermostimulated depolarization current (TSD) analysis, infrared (IR) spectroscopy and size exclusion chromatography (SEC). TSD spectra clearly indicate structural changes occurring during oxidation of the material. For the virgin samples, evidence for existence of only a weak α process were found, but the oxidation led, at its initial stage, to the appearance of both γ and β processes, whereas the intensity of the α process remained initially unchanged. The results of the other analyses show that the oxidation process takes place in the amorphous phase and results in a significant reduction of molecular mass, which is the main factor contributing to the embrittlement of the polymer. TSD also indicated creation of deep electronic states, possibly at the amorphous-crystalline boundaries
  • Keywords
    chromatography; deep levels; embrittlement; organic insulating materials; oxidation; polymers; spectrochemical analysis; thermally stimulated currents; IR spectroscopy; MDPE; TSD analysis; TSD spectra; amorphous phase; amorphous-crystalline boundaries; beta processes; deep electronic states; gamma process; infrared spectroscopy; medium-density polyethylene; molecular mass; polymer embrittlement; size exclusion chromatography; thermal oxidation; thermostimulated depolarization current; weak alpha process; Amorphous materials; Chemicals; Infrared spectra; Oxidation; Performance analysis; Polyethylene; Polymers; Spectroscopy; Stress; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-0649-X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1992.247029
  • Filename
    247029