An accurate method for numerical simulation of electrical tree growth process by finite element method

The electrical tree growth process was simulated by using the two-dimensional finite element method. A new algorithm was developed for investigating the electrical tree growth mechanism, utilizing the concepts of the critical field F_c and the breakdown field F_b, which are estimated from the results of tree initiation experiments. It is shown that the F_c and F_b are the key parameters for evaluating the growth probability function. The simulated tree patterns were found to agree well with the experimental tree patterns. The simulations showed that the topology of the tree pattern was critically controlled by the growth probability function shapes