An accurate method for numerical simulation of electrical tree growth process by finite element method

Author

Lee, June-Ho ; Park, Gwan-Soo ; Dong-Young, Yi ; Kim, Seong-Gyun ; Hahn, Song-Yop ; Han, Min-Koo

Author_Institution

Dept. of Electr. Eng., Seoul Nat. Univ., South Korea

fYear

1992

fDate

7-10 Jun 1992

Firstpage

70

Lastpage

73

Abstract

The electrical tree growth process was simulated by using the two-dimensional finite element method. A new algorithm was developed for investigating the electrical tree growth mechanism, utilizing the concepts of the critical field F_c and the breakdown field F_b, which are estimated from the results of tree initiation experiments. It is shown that the F_c and F_b are the key parameters for evaluating the growth probability function. The simulated tree patterns were found to agree well with the experimental tree patterns. The simulations showed that the topology of the tree pattern was critically controlled by the growth probability function shapes

Keywords

electric breakdown of solids; finite element analysis; breakdown field; critical field; dielectric failure; electrical tree growth process; growth probability function; numerical simulation; simulated tree patterns; tree initiation experiments; tree pattern probability; two-dimensional finite element method; Boundary conditions; Dielectrics; Electric breakdown; Finite element methods; Information geometry; Laplace equations; Numerical simulation; Shape control; Solid modeling; Trees - insulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on

Conference_Location

Baltimore, MD

ISSN

1089-084X

Print_ISBN

0-7803-0649-X

Type

conf

DOI

10.1109/ELINSL.1992.247049

Filename

247049