The refractive index of InP and its temperature dependence in the wavelength range from 1.2 μm to 1.6 μm

Author

Gini, Emilio ; Melchior, Hans

Author_Institution

Inst. for Quantum Electron., Swiss Federal Inst. of Technol., Zurich, Switzerland

fYear

1996

fDate

21-25 Apr 1996

Firstpage

594

Lastpage

597

Abstract

Measurements of the refractive index of InP in the wavelength range from 1.2 μm to 1.6 μm have been carried out with a relative accuracy of 2×10^-4. The refractive indices are determined from the measured transmission wavelengths of an n^-/n⁺-InP demultiplexer and their temperature dependence. The refractive indices are found to vary linearly with temperature with a coefficient between 2.3 and 1.9×10^-4/K. The results are compared with data from literature

Keywords

III-V semiconductors; demultiplexing; indium compounds; integrated optics; light transmission; optical materials; refractive index; 1.2 to 1.6 mum; InP; integrated optical demultiplexer; n^-/n⁺-InP demultiplexer; refractive index; temperature dependence; transmission wavelengths; Gratings; Indium phosphide; Optical devices; Optical fiber polarization; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Temperature dependence; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on

Conference_Location

Schwabisch-Gmund

Print_ISBN

0-7803-3283-0

Type

conf

DOI

10.1109/ICIPRM.1996.492318

Filename

492318