Title :
Photoelastic measurements of mechanical stresses induced in XLPE during electrical aging
Author :
David, E. ; Parpal, J.-L. ; Crine, J.-P.
Author_Institution :
Inst. de Recherche d´´Hydro-Quebec, Varennes, Que., Canada
Abstract :
The mechanical response of cross-linked polyethylene (XLPE) to a cyclic stress induced by oscillating electrostatic forces could be an important factor with regard to long-term degradation. To demonstrate the presence of mechanical stresses induced by high electric fields in XLPE, the authors performed photoelastic measurements. These measurements were conducted on tip-plane-geometry XLPE samples to estimate the distribution of the internal mechanical stress resulting from the application of a 5-kV, 1-kHz AC voltage for up to 3000 h. The results obtained show a time-dependent photoelastic pattern suggesting some structural change in the area located at the tip of the electrode
Keywords :
ageing; birefringence; electric breakdown of solids; insulation testing; organic insulating materials; photoelasticity; polymers; stress measurement; 1 kHz; 5 kV; AC voltage; cross-linked polyethylene; cyclic stress; electrical ageing; internal mechanical stress; long-term degradation; mechanical response; oscillating electrostatic forces; photoelastic measurements; polymer insulating materials; time-dependent photoelastic pattern; tip-plane-geometry XLPE samples; Degradation; Electric fields; Electric variables measurement; Electrostatic measurements; Mechanical variables measurement; Performance evaluation; Photoelasticity; Polyethylene; Stress measurement; Voltage;
Conference_Titel :
Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0649-X
DOI :
10.1109/ELINSL.1992.247053
