Photoelastic measurements of mechanical stresses induced in XLPE during electrical aging

Author

David, E. ; Parpal, J.-L. ; Crine, J.-P.

Author_Institution

Inst. de Recherche d´´Hydro-Quebec, Varennes, Que., Canada

fYear

1992

fDate

7-10 Jun 1992

Firstpage

52

Lastpage

56

Abstract

The mechanical response of cross-linked polyethylene (XLPE) to a cyclic stress induced by oscillating electrostatic forces could be an important factor with regard to long-term degradation. To demonstrate the presence of mechanical stresses induced by high electric fields in XLPE, the authors performed photoelastic measurements. These measurements were conducted on tip-plane-geometry XLPE samples to estimate the distribution of the internal mechanical stress resulting from the application of a 5-kV, 1-kHz AC voltage for up to 3000 h. The results obtained show a time-dependent photoelastic pattern suggesting some structural change in the area located at the tip of the electrode

Keywords

ageing; birefringence; electric breakdown of solids; insulation testing; organic insulating materials; photoelasticity; polymers; stress measurement; 1 kHz; 5 kV; AC voltage; cross-linked polyethylene; cyclic stress; electrical ageing; internal mechanical stress; long-term degradation; mechanical response; oscillating electrostatic forces; photoelastic measurements; polymer insulating materials; time-dependent photoelastic pattern; tip-plane-geometry XLPE samples; Degradation; Electric fields; Electric variables measurement; Electrostatic measurements; Mechanical variables measurement; Performance evaluation; Photoelasticity; Polyethylene; Stress measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on

Conference_Location

Baltimore, MD

ISSN

1089-084X

Print_ISBN

0-7803-0649-X

Type

conf

DOI

10.1109/ELINSL.1992.247053

Filename

247053