• DocumentCode
    3386324
  • Title

    A systematic analysis of the voltage-dependent noise characteristics of active CMOS mixers

  • Author

    Wu, Rui ; Ma, Jianguo

  • Author_Institution
    Sch. of EE, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2009
  • fDate
    23-25 July 2009
  • Firstpage
    762
  • Lastpage
    766
  • Abstract
    The drain-source-voltage-dependent noise characteristics of active CMOS mixers are analyzed systematically. Explicit expressions of the output noise and noise figure considering the coupled thermal- and shot-noise are presented. The expressions can be used to predict the influence of the voltage-dependent noise sources of the MOSFETs on the output noise of an active CMOS mixer.
  • Keywords
    CMOS integrated circuits; MOSFET; integrated circuit noise; mixers (circuits); shot noise; MOSFET; active CMOS mixer; shot-noise; thermal noise; voltage-dependent noise characteristics; 1f noise; Active circuits; Active noise reduction; Circuit noise; MOSFETs; Noise figure; Semiconductor device modeling; Switches; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on
  • Conference_Location
    Milpitas, CA
  • Print_ISBN
    978-1-4244-4886-9
  • Electronic_ISBN
    978-1-4244-4888-3
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2009.5250399
  • Filename
    5250399
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3386324