Title :
A systematic analysis of the voltage-dependent noise characteristics of active CMOS mixers
Author :
Wu, Rui ; Ma, Jianguo
Author_Institution :
Sch. of EE, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
The drain-source-voltage-dependent noise characteristics of active CMOS mixers are analyzed systematically. Explicit expressions of the output noise and noise figure considering the coupled thermal- and shot-noise are presented. The expressions can be used to predict the influence of the voltage-dependent noise sources of the MOSFETs on the output noise of an active CMOS mixer.
Keywords :
CMOS integrated circuits; MOSFET; integrated circuit noise; mixers (circuits); shot noise; MOSFET; active CMOS mixer; shot-noise; thermal noise; voltage-dependent noise characteristics; 1f noise; Active circuits; Active noise reduction; Circuit noise; MOSFETs; Noise figure; Semiconductor device modeling; Switches; Transconductance; Voltage;
Conference_Titel :
Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on
Conference_Location :
Milpitas, CA
Print_ISBN :
978-1-4244-4886-9
Electronic_ISBN :
978-1-4244-4888-3
DOI :
10.1109/ICCCAS.2009.5250399
