Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Automatic testing; Circuit testing; Conferences; Educational programs; Integrated circuit testing; Integrated circuit yield; Semiconductor device testing; System testing; Technological innovation; Test data compression;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location :
Palm Springs, California, USA
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.46
