• DocumentCode
    3386581
  • Title

    Test technology educational program: Overview of tutorials

  • fYear
    2005
  • fDate
    1-5 May 2005
  • Abstract
    The Tutorials & Education Group of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2005 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings and included in the annual and expanding Test Technology Educational Program (TTEP). TTEP intends to serve the test and design professionals offering fundamental education and expert knowledge in state-ofthe- art test technology topics. Participation in TTEP-organized tutorials is credited by TTTC. Each full day tutorial corresponds to four TTEP units. Upon completion of each sixteen TTEP units official accreditation in the form of an "IEEE TTTC Test Technology Certificate" will be presented to the participants. In addition to the tutorials, certified university courses and industrial seminars related to test technology can also be included in TTEP and the participation in these credited similar to TTEP tutorials. For information on TTEP 2005 please visit the TTEP web site http://tab.computer.org/tttc/teg/ttep. The test technology tutorials of the VTS 2005 technical program are part of TTEP 2005.
  • Keywords
    Computer Society; Computer science education; Design engineering; Educational programs; Educational technology; Manufacturing; National electric code; Reliability engineering; Testing; Tutorial;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
  • Conference_Location
    Palm Springs, California, USA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2314-5
  • Type

    conf

  • DOI
    10.1109/VTS.2005.83
  • Filename
    1443388