Title :
Signal integrity verification of coupled interconnect lines using efficient eye-diagram determination
Author :
Kim, Dongchul ; Kim, Hyewon ; Eo, Yungseon
Author_Institution :
Dept. Electr. & Comput. Eng., Hanyang Univ., Ansan, South Korea
fDate :
May 30 2010-June 2 2010
Abstract :
An efficient signal integrity verification method of coupled interconnect lines is presented. Two coupled lines are decoupled into isolated eigen modes. Then, bit blocks for coupled lines which are composed of the finite size of bits are represented with the fundamental modes. In addition, the crosstalk effects within the bit block are taken into account. Thereby, the crucial input bit patterns for the worst case eye-diagram determination are mathematically modeled, followed by analytical eye-diagram determination. It is shown that not only the proposed technique has excellent agreement with SPICE W-model-based simulation but also is it very computation-time-efficient, compared with SPICE simulation.
Keywords :
eigenvalues and eigenfunctions; signal processing; SPICE W-model-based simulation; coupled interconnect lines; crosstalk effect; eigen modes; eye-diagram determination; signal integrity verification; Analytical models; Computational modeling; Crosstalk; Delay; Digital systems; Energy dissipation; Mathematical model; Pattern analysis; SPICE; Signal analysis;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537774