Abstract :
The advances of deep sub-micron process manufacturing technologies have enabled System-on-Chip designs. On the other hand, they also greatly complicate testing for SoC devices and require advanced test methods such as scan-based at-speed testing. The embedded core design style is widely adopted for SoC designs because the reuse of the previously designed Intellectual Property (IP) cores lowers design costs and shortens time-to-market. However, since such SoC devices incorporate various design technologies (such as microprocessor, static/dynamic/flash/cache memory, high-speed logic/IO and even analog circuits), the complexity of SoC testing further increases and hence sophisticated design-for-testability (DFT) techniques are required. Built-In Self-Test (BIST) is a one of the popular DFT approaches because it not only applies test at-speed, but also reduces test costs. In addition, BIST circuitry of SoC devices can be made accessible via boundary scan architecture (a.k.a JTAG) to facilitate board and system level test. The deployment of 3G wireless systems has significantly elevated the complexity of wireless SoC designs for higher performance and capacity as well as the capability of handling multimedia - such as voice, date, graphics, music and video. Therefore, there are a lot of challenges posed in design and test for wireless SoCs. In this Innovative Practice session, speakers from Bell Labs Lucent Technologies, Qualcomm Inc, and Intel Corp will present the leading edge DFT techniques for their wireless SoC chips used in 3G wireless base stations and handsets.
