Title :
ICECS 2008 at a glance
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
Provides a schedule of conference events and a listing of which papers were presented in each session.
Keywords :
Analog-digital conversion; Automatic testing; Circuit testing; Design automation; Digital signal processing; Electronic equipment testing; Integrated circuit testing; Logic testing; Matrix converters; Signal design;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
DOI :
10.1109/ICECS.2008.4675122
