DocumentCode :
3387082
Title :
Production test methods for measuring ´out-of-band´ interference of ultra wide band (UWB) devices
Author :
Bhattacharya, Soumendu ; Chatterjee, Abhijit
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2005
fDate :
1-5 May 2005
Firstpage :
137
Lastpage :
142
Abstract :
The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on ´out-of-band´ interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of ´out-of-band´ interference can be obtained easily using the proposed test methodology.
Keywords :
4G mobile communication; channel allocation; interference (signal); production testing; ultra wideband communication; 3.1 to 10.6 GHz; 4G devices; FCC spectrum regulations; UWB devices; channel model; data transmission; out-of-band interference measurement; power spectral density; production testing; spectral power leakage; ultra wide band devices; wireless standards; Bandwidth; Costs; Data communication; Frequency; Interference; Passband; Production; Pulse shaping methods; Testing; Ultra wideband technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
ISSN :
1093-0167
Print_ISBN :
0-7695-2314-5
Type :
conf
DOI :
10.1109/VTS.2005.67
Filename :
1443411
Link To Document :
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