DocumentCode
3387106
Title
3C: IP Session - Soft Errors [Breaker page]
fYear
2005
fDate
1-5 May 2005
Firstpage
143
Lastpage
143
Abstract
Radiation induced soft errors impose a major challenge in the design of robust systems targeted for enterprise computing and networking applications. Major factors behind this trend include increasing system-level soft error rates with technology scaling, and stringent system data integrity requirements of target applications. There are several challenges and gaps in understanding system behaviors in the presence of soft errors. Excessive power, performance and area overheads challenge direct application of classical redundancy techniques for soft error detection and recovery. This session will present industrial perspectives on how to improve our understanding of system-level effects of soft errors and design techniques for soft error resilient robust systems.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location
Palm Springs, California, USA
ISSN
1093-0167
Print_ISBN
0-7695-2314-5
Type
conf
DOI
10.1109/VTS.2005.20
Filename
1443412
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