Title :
Towards an understanding of no trouble found devices
Author_Institution :
Sun Microsystems, Inc., Sunnyvale, CA, USA
Abstract :
This paper gives a model for understanding no trouble found (NTF) parts, including predictions of how many can be expected at different stages of a product life cycle, an understanding of when NTFs are of concern, and when they are to be expected. We also show how NTF rates can be used as a measure of process health.
Keywords :
integrated circuit testing; microprocessor chips; production testing; SUN Sparc microprocessor; integrated circuit testing; no trouble found devices; process health measurement; product life cycle; Analytical models; Data analysis; Integrated circuit testing; Life testing; Manufacturing processes; Microprocessors; Predictive models; Sun; System testing; Waste materials;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.86
