Linear logistic regression: an introduction

This paper provides an introduction to Linear Logistic Regression and its value in semiconductor yield and reliability analysis. The reliability community has become well experienced in fitting of survival distributions, the use of design of experiments (DOE) and the associated general linear model (linear regression and analysis of variance methods) approach to analysis. This method provides a solution to the general linear model when the dependent variable is nominal, either a dichotomous (two level), polychotomous (multi-level) or even ordered polychotomous response.