• DocumentCode
    3387270
  • Title

    Density-dependent electron transport for accurate modeling of AlGaN/GaN HEMTs

  • Author

    Bajaj, Sanyam ; Shoron, Omor F. ; Pil Sung Park ; Krishnamoorthy, Sriram ; Akyol, Fatih ; Ting-Hsiang Hung ; Reza, Shahed ; Chumbes, Eduardo M. ; Khurgin, Jacob B. ; Rajan, Siddharth

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    33
  • Lastpage
    34
  • Abstract
    Summary form only given. We report on accurate modeling of GaN HEMTs for RF operation taking into account sheet charge density (ns) dependence of electron velocity in 2-dimensional electron gases (2DEGs). Electron velocity characteristics of the channel directly impact DC and high frequency transistor performance, and it is critical to understand velocity at all charge density and field conditions to accurately predict large signal performance of GaN HEMTs. Previous models of AlGaN/GaN HEMTs have taken into account field dependence of electron velocity, but have not considered its dependence on channel sheet charge density [1]. In this work, we have directly measured velocity characteristics of 2DEGs as a function of field and sheet charge density, and used them to accurately simulate DC and small signal characteristics of GaN HEMTs. The work done here provides a method to accurately simulate DC and RF characteristics of GaN HEMTs over the entire bias range.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; velocity measurement; wide band gap semiconductors; 2D electron gases; 2DEG; AlGaN-GaN; HEMT; RF operation; channel sheet charge density; density-dependent electron transport; electron velocity; high electron mobility transistors; high frequency transistor performance; Gallium nitride; HEMTs; MODFETs; Optical wavelength conversion; Phonons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175538
  • Filename
    7175538