Title :
A new approach in flash-memory testing to increase quality and reduce cycle time on improvements
Author :
Giglio, G. ; Masi, T. ; Mastrocola, M. ; Morgana, F.
Author_Institution :
STMicroelectronics, Catania, Italy
Abstract :
We have developed a methodology to reduce cycle time on improvements in FLASH-Memory 0.18um CMOS devices, utilizable on all non-volatile memories. With this method it is possible to perform speedily all improvements even having statistic on few devices.
Keywords :
CMOS memory circuits; flash memories; integrated circuit testing; 0.18 micron; CMOS device; cycle time; flash memory testing; nonvolatile memory; quality level; Costs; Databases; Design engineering; Failure analysis; Feedback; Flowcharts; Manufacturing; Nonvolatile memory; Statistics; Testing;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2002. IEEE International
Print_ISBN :
0-7803-7558-0
DOI :
10.1109/IRWS.2002.1194268
