Title :
Soft error mitigation for SRAM-based FPGAs
Author :
Asadi, Ghazanfar-Hossein ; Tahoori, Mehdi Baradaran
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
FPGA-based designs are more susceptible to single-event up-sets (SEUs) compared to ASIC designs, since SEUs in configuration bits of FPGAs result in permanent errors in the mapped design. Moreover, the number of sensitive configuration bits is two orders of magnitude more than user bits in typical FPGA-based circuits. In this paper, we present a high-reliable low-cost mitigation technique which can significantly improve the availability of designs mapped into FPGAs. Experimental results show that, using this technique, the availability of an FPGA mapped design can be increases to more than 99%.
Keywords :
SRAM chips; application specific integrated circuits; error correction; field programmable gate arrays; integrated circuit design; transients; ASIC designs; FPGA mapped design; FPGA-based circuits; FPGA-based designs; SRAM-based FPGA; field programmable gate array; single-event upsets; soft error mitigation; Circuits; Computer errors; Costs; Design engineering; Error analysis; Fault tolerance; Field programmable gate arrays; Protection; Single event transient; Single event upset;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.75