6C: IP Session - IP in Wireless Testing [breaker page]

The last few years have witnessed a significant increase in the demand for wireless applications ranging from cellphones, to Bluetooth-enabled appliances, to Wireless LAN in computers. The deployment of wireless interfaces in consumer applications has led to finding economic ways of integrating them in these devices. Industry is moving towards RFSoCs where RF components are integrated into SoCs for reducing manufacturing cost. This integration creates a new challenge for testing integrated RFSoCs. Low cost testing of RFSoCs is a big test challenge that industry needs to face, especially due the fact that these devices are getting deployed in consumer application that have low overall cost. Industry as whole is exploring ways to economically test these devices. This session will present three papers industry that will highlight the problems of testing RFSoCs and the innovative solutions that have been developed to address them. The first paper from will highlight how the production testing is changing with the integration of RF interfaces into SoCs. The second paper will discuss the loadboard-based solution that has been developed at Cypress semiconductors for addressing their RF testing problem. The last paper will the present the RF testing approach that has been pursued at Texas Instruments and how they see the future of RF testing evolving.