Title :
Static compaction of delay tests considering power supply noise
Author :
Wang, Jing ; Qiu, Wangqi ; Fancler, Steve ; Walker, D.M.H. ; Lu, Xiang ; Yue, Ziding ; Shi, Weiping
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid environments are presented.
Keywords :
compaction; integrated circuit modelling; integrated circuit testing; power supply circuits; ISCAS89 circuits; KLPG delay tests; power supply noise; static compaction algorithm; Circuit faults; Circuit noise; Circuit testing; Compaction; Crosstalk; Delay; Noise generators; Noise level; Power supplies; Timing;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.77
