Title :
Vertical cavity surface emitting lasers based on InP and related compounds-bottleneck and corkscrew
Author_Institution :
Tokyo Inst. of Technol., Yokohama, Japan
Abstract :
The author reviews the progress of surface emitting lasers ranging from 1.55 to 0.4 μm by considering materials and performance, including threshold, power output, polarization, RIN, linewidth, spontaneous emission control, and photon recycling. Some possible applications are discussed
Keywords :
III-V semiconductors; indium compounds; optical interconnections; semiconductor lasers; surface emitting lasers; 1.55 to 0.4 mum; GaAlAs-GaAs; GaInAs-GaAs; GaInAsP-InP; InP; InP substrate; RIN; VCSEL; linewidth; materials; optical interconnects; performance; photon recycling; polarization; power output; spontaneous emission control; threshold; vertical cavity surface emitting lasers; Gallium arsenide; Indium phosphide; Laser modes; Mirrors; Optical losses; Substrates; Surface emitting lasers; Temperature; Thermal conductivity; Vertical cavity surface emitting lasers;
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
DOI :
10.1109/ICIPRM.1996.492395