Title :
B2L-F Design Automation and Test III
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
DOI :
10.1109/ICECS.2008.4675164
