• DocumentCode
    3387836
  • Title

    Applications of fs lasers to nonlinear spectroscopy and process control of Si

  • Author

    Dadap, Jerry I. ; Hu, X.F. ; Anderson, M.H. ; Beek, M.T. ; Aktsipetrov, O.A. ; Russell, N.M. ; Ekerdt, John G.

  • Author_Institution
    Center for Synthesis, Growth & Anal. of Electron. Mater., Texas Univ., Austin, TX, USA
  • fYear
    1996
  • fDate
    5-9 Aug. 1996
  • Firstpage
    43
  • Lastpage
    44
  • Abstract
    Si(O0 1) interfaces are among the most technologically important for nonlinear optical analysis, yet their exceptionally weak interfacial second harmonic susceptibility )I12)hsa s strongly inhibited quantitative interface-specific second harmonic (SH) spectroscopy and related nonlinear optical process control applications. The advent of widely tunable. unamplified femtosecond (fs) solid-state lasers has overcome this banier by enabling unprecedented SH generation efficiency (- lo6 photons/s) with minimal interface heating.
  • Keywords
    Ge-Si alloys; MIS structures; adsorption; chromium; electro-optical effects; elemental semiconductors; modulation spectra; optical harmonic generation; semiconductor growth; semiconductor materials; silicon; silicon compounds; space charge; time resolved spectra; vapour phase epitaxial growth; 1 fs; H; Si-SiO/sub 2/-Cr; SiGe; UHV chemical vapor deposition; carrier dynamics; fs lasers; fs-time-resolved SH pump-probe study; hydrogen coverage; interface-specific second harmonic electro-modulation spectroscopy study; nonlinear spectroscopy; process control; real-time SH monitoring; space-charge region; Chemical technology; Harmonic analysis; Kinetic theory; Laser applications; Monitoring; Nonlinear optics; Process control; Resonance; Spectroscopy; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Applications of Lasers in Materials Processing/Broadband Optical Networks/Smart Pixels/Optical MEMs and Their Applications. IEEE/LEOS 1996 Summer Topical Meetings:
  • Conference_Location
    Keystone, CO, USA
  • Print_ISBN
    0-7803-3175-3
  • Type

    conf

  • DOI
    10.1109/LEOSST.1996.540670
  • Filename
    540670