Title :
Neural-network representation of Voltage Stability Indices at the voltage collapse
Author :
Lage, G.G. ; Fernandes, Ricardo A. S. ; da Costa, Geraldo R. M.
Author_Institution :
Dept. of Electr. Eng., Univ. of Sao Paulo, Sao Carlos, Brazil
Abstract :
Representing system security in power flow based system models by the scalar magnitude of a Voltage Stability Index (VSI) may be a very difficult task, which may even render the applicability of such models impractical. VSIs at voltage collapse points are difficult to predict when reactive power generation limits are taken into account in system modeling. Therefore, this paper proposes the determination of the Minimum Singular Value (MSV) and the Tangent Vector Norm (TVN) indices at the voltage collapse by means of Neural Networks (NN), being the latter a novel VSI based on the norm of the tangent vectors used in voltage collapse assessment. In order to determine voltage collapse points for different patterns of load and generation increase, an Optimal Power Flow (OPF) approach for solving the maximum loading problem was used. With these points, the MSV and TVN were calculated and used for training and testing the NNs. A small, but realistic, 6-bus system was used for carrying out this study. Results have shown that NNs can be readily applied to representing some VSIs at the voltage collapse. This approach overcomes some difficulties encountered in problems that account for system security through these VSIs.
Keywords :
load flow; neural nets; power engineering computing; power system simulation; reactive power; stability; 6-bus system; minimum singular value indices; neural network representation; optimal power flow; reactive power generation; representing system security; scalar magnitude; tangent vector norm indices; voltage collapse; voltage stability indices; Artificial neural networks; Bifurcation; Jacobian matrices; Load modeling; Loading; Mathematical model; Power system stability;
Conference_Titel :
North American Power Symposium (NAPS), 2011
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4577-0417-8
Electronic_ISBN :
978-1-4577-0418-5
DOI :
10.1109/NAPS.2011.6025165