Title :
Hierarchical compactor design for diagnosis in deterministic logic BIST
Author :
Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay ; Hay, Cy ; Gizdarski, Emil ; Mathew, Ben
Author_Institution :
Synopsys Inc., Mountain View, CA, USA
Abstract :
Scan-based tests created by automatic test pattern generators (ATPG) can be efficiently compressed and applied in a deterministic built-in self-test (DBIST) architecture. However, the BIST environment adds significant complexity to failure diagnosis. We present a simple scan-compatible diagnosis solution - streaming DBIST (SDBIST), which is based on a low-overhead hierarchical compactor SDBIST allows continuously monitoring streaming scanout data for reduced-volume expect-data diagnosis, on-line fail-data collection and selective scan cell masking.
Keywords :
automatic test pattern generation; built-in self test; fault diagnosis; integrated circuit testing; logic testing; automatic test pattern generators; deterministic built-in self-test; deterministic logic BIST; failure diagnosis; low-overhead hierarchical compactor; on-line fail-data collection; reduced-volume expect-data diagnosis; scan-based tests; scan-compatible diagnosis; selective scan cell masking; streaming DBIST; streaming scanout data; Built-in self-test; Codecs; Computer architecture; Condition monitoring; Logic design; Logic testing; Performance evaluation; Pins; Silicon; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.48
