Title :
11C: IP Session - Delay Fault Testing: Industrial Case Studies [Breaker page]
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location :
Palm Springs, California, USA
Print_ISBN :
0-7695-2314-5
DOI :
10.1109/VTS.2005.25
