DocumentCode
3388177
Title
CZT/NaI hybrid hand-held performance evaluation
Author
Russ, W. ; Nakazawa, D. ; Hau, I. ; Morichi, M.
Author_Institution
R&D, Canberra Ind., Meriden, CT, USA
fYear
2010
fDate
8-10 Nov. 2010
Firstpage
363
Lastpage
367
Abstract
New hybrid spectroscopic systems directly combine spectra from detectors with very different energy resolutions, accommodating standard analyses of the output hybrid spectrum. Hand-held hybrid systems consisting of a 0.5 cm3 cadmium zinc telluride detector combined with either a 1 cm3 NaI(Tl) scintillator mounted on a photomultiplier tube or a 1 cm3 CsI(Tl) mounted on a silicon photomultiplier were evaluated for performance by source measurements for a variety of acquisition times. Repeated 300 second background measurements were analyzed and found a small increase in false alarm rate for the hybrid combinations compared to the individual component detectors. Repeated measurements with a 100 μR/h 137Cs source and acquisition times of 5, 10, 30, 100, and 300 seconds were analyzed, with the results showing that significantly enhances peak detectability relative to the individual constituent detectors, especially at shorter times. At 5 and 10 seconds, the probability of detection was more than twice that of the individual components. The hybrid approach enables the consideration of a greater variety of measurement system solutions in terms of cost and performance.
Keywords
photomultipliers; position sensitive particle detectors; silicon radiation detectors; solid scintillation detectors; CsI(Tl) scintillator; NaI(Tl) scintillator; acquisition times; cadmium zinc telluride detector; false alarm rate; hand-held hybrid systems; hybrid spectroscopic systems; individual component detectors; output hybrid spectrum; photomultiplier tube; silicon photomultiplier; Calibration; Crystals; Detectors; Energy resolution; Photomultipliers; Sensitivity; Testing; CZT; CsI; NaI; SiPM; hand-held; hybrid; system;
fLanguage
English
Publisher
ieee
Conference_Titel
Technologies for Homeland Security (HST), 2010 IEEE International Conference on
Conference_Location
Waltham, MA
Print_ISBN
978-1-4244-6047-2
Type
conf
DOI
10.1109/THS.2010.5654934
Filename
5654934
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