Soft error immune GaAs circuit technologies

Author

Weatherford, T.R. ; Fouts, D.J. ; Marshall, P.W. ; Marshall, C.J. ; Dietrich, H.

Author_Institution

Naval Postgraduate Sch., Monterey, CA, USA

Volume

2

fYear

1997

fDate

3-6 Aug. 1997

Firstpage

1116

Abstract

Cosmic radiation induced soft errors present a major difficulty for space applications that utilize digital GaAs circuits and systems. Techniques to reduce soft error sensitivity by 5 orders of magnitude or more, to sufficient levels for safe implemention of GaAs ICs in space applications are presented. These results show that the need for redundancy and error correction is eliminated. Space systems will benefit by reduced power and area requirements, plus a substantial improvement in system performance over present radiation hardened silicon-based technologies.

Keywords

III-V semiconductors; errors; field effect digital integrated circuits; gallium arsenide; integrated circuit technology; radiation hardening (electronics); space vehicle electronics; GaAs; GaAs ICs; cosmic radiation induced errors; digital GaAs circuits; radiation hardened GaAs-based technology; soft error immune IC technologies; soft error sensitivity reduction; space applications; Circuit simulation; Circuits and systems; Error analysis; Error correction; FETs; Frequency; Gallium arsenide; Logic circuits; MESFETs; Space technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on

Print_ISBN

0-7803-3694-1

Type

conf

DOI

10.1109/MWSCAS.1997.662273

Filename

662273